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Publication:3989986

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Display titleScheduling semiconductor test operations: Minimizing maximum lateness and number of tardy jobs on a single machine
Default sort key3989986
Page length (in bytes)15
Namespace ID4206
NamespacePublication
Page ID8512627
Page content languageen - English
Page content modelwikitext
Indexing by robotsAllowed
Number of redirects to this page0
Counted as a content pageYes
MaRDI portal item IDQ3989986
Central descriptionscientific article; zbMATH DE number 35511

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Page creatorImport240129110155 (talk | contribs)
Date of page creation00:13, 30 January 2024
Latest editorImport240129110155 (talk | contribs)
Date of latest edit00:13, 30 January 2024
Total number of edits1
Recent number of edits (within past 90 days)0
Recent number of distinct authors0

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