Pages that link to "Item:Q1011272"
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The following pages link to Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272):
Displaying 4 items.
- The effect of testing errors on a repetitive testing process (Q1926710) (← links)
- The effect of testing equipment shift on optimal decisions in a repetitive testing process (Q2462127) (← links)
- A new discrete distribution (Q5169762) (← links)
- On bivariate discrete Weibull distribution (Q5866088) (← links)