The following pages link to SEC-DED (Q15740):
Displaying 16 items.
- Binary set functions and parity check matrices (Q914651) (← links)
- On Generating the N-ary Reflected Gray Codes (Q3331130) (← links)
- A Class of Odd-Weight-Column SEC-DED-SbED Codes for Memory System Applications (Q3331132) (← links)
- SEC-BED-DED Codes for Error Control in Byte-Organized Memory Systems (Q3684032) (← links)
- A Self-Checking Generalized Prediction Checker and Its Use for Built-In Testing (Q3744092) (← links)
- A Construction Method of High-Speed Decoders Using ROM's for Bose–Chaudhuri–Hocquenghem and Reed–Solomon Codes (Q3786398) (← links)
- Linear sum codes for random access memories (Q3795611) (← links)
- (Q3859709) (← links)
- SEC-DED Nonbinary Code for Fault-Tolerant Byte-Organized Memory Implemented with Quaternary Logic (Q3914892) (← links)
- Single Byte Error Correcting—Double Byte Error Detecting Codes for Memory Systems (Q3944503) (← links)
- Implementation of an Experimental Fault-Tolerant Memory System (Q4094790) (← links)
- Measurement and Generation of Error Correcting Codes for Package Failures (Q4149657) (← links)
- A Class of Linear Codes for Error Control in Byte-per-Card Organized Digital Systems (Q4156297) (← links)
- Erasure and Error Decoding for Semiconductor Memories (Q4166693) (← links)
- On-line testing for VLSI: state of the art and trends (Q4225371) (← links)
- A class of error-locating codes for byte-organized memory systems (Q4850286) (← links)
