Pages that link to "Item:Q1705604"
From MaRDI portal
The following pages link to Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report (Q1705604):
Displaying 5 items.
- Towards VHDL-based design of reversible circuits. Work in progress report (Q1705586) (← links)
- Test pattern generation effort evaluation of reversible circuits (Q1705602) (← links)
- Fault diagnosis in reversible circuits under missing-gate fault model (Q1952518) (← links)
- Efficient techniques for fault detection and location of multiple controlled Toffoli-based reversible circuit (Q2099595) (← links)
- (Q3869272) (← links)