Pages that link to "Item:Q1878235"
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The following pages link to On the influence of noise in the evaluation of the electrical oscillations occurring in the \(\alpha\)-Si/Si(p)/Si(n) device (Q1878235):
Displaying 5 items.
- Nonlinear electronic circuit. I: Multiple routes to chaos. (Q419708) (← links)
- A reliability study of square wave bursting \(\beta\)-cells with noise (Q717910) (← links)
- Oscillations in the \(\alpha\)-si/Si(p)/Si(n) device: Embedding- and correlation dimensions (Q1878246) (← links)
- Bifurcation diagram, noise reduction and period-four cycle on low frequency current oscillations in a semi-insulating GaAs sample (Q1888116) (← links)
- External Noise Effects in Silicon MOS Inversion Layer (Q5359926) (← links)