Pages that link to "Item:Q2087079"
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The following pages link to On the choice of the optimal tuning parameter in robust one-shot device testing analysis (Q2087079):
Displaying 3 items.
- Power divergence approach for one-shot device testing under competing risks (Q2088826) (← links)
- Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks (Q6049270) (← links)
- Adaptation of the tuning parameter in general Bayesian inference with robust divergence (Q6171768) (← links)
