Pages that link to "Item:Q2294820"
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The following pages link to Capability-based quick switching sampling system for lot disposition (Q2294820):
Displaying 13 items.
- Optimal truncated repetitive lot inspection with defect rates (Q1985091) (← links)
- Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (Q2032232) (← links)
- Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design (Q2184150) (← links)
- Optimal lot sentencing based on defective counts and prior acceptability (Q2223885) (← links)
- An adjustable inspection scheme for lot sentencing based on one-sided capability indices (Q2243495) (← links)
- Optimal lot disposition from Poisson-Lindley count data (Q2310620) (← links)
- Designing of variables quick switching sampling system by considering process loss functions (Q2978995) (← links)
- A two-sided SPRT control chart for process dispersion (Q3390361) (← links)
- An improved sampling plan by variables inspection with consideration of process yield and quality loss (Q5107463) (← links)
- Integrated QSS-RS plans based on the process yield index for lot acceptance determination (Q6067511) (← links)
- Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process (Q6082989) (← links)
- Design and construction of a quick-switching sampling system with a third-generation capability index (Q6107541) (← links)
- Quick-switch inspection scheme based on the overall process capability index for modern industrial web-based processing environment (Q6580745) (← links)