Pages that link to "Item:Q2301792"
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The following pages link to Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792):
Displaying 2 items.
The following pages link to Damage and hotspot formation simulation for impact-shear loaded PBXs using combined microcrack and microvoid model (Q2301792):
Displaying 2 items.