Pages that link to "Item:Q2356510"
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The following pages link to On tests detecting certain faults of circuit inputs for almost all Boolean functions (Q2356510):
Displaying 10 items.
- Boolean derivative calculation with application to fault detection of combinational circuits via the semi-tensor product method (Q417823) (← links)
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs (Q828193) (← links)
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases (Q2136299) (← links)
- Short complete diagnostic tests for circuits implementing linear Boolean functions (Q2690960) (← links)
- Testing Odd-Cycle-Freeness in Boolean Functions (Q3168444) (← links)
- Detecting tests for Boolean functions in presence of local linear faults of the inputs of circuits (Q3186817) (← links)
- MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE (Q3741577) (← links)
- Synthesis of easily testable circuits over the basis {&, ∨, ⁻} for systems of Boolean functions (Q4917386) (← links)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two (Q4973245) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
