Pages that link to "Item:Q2478891"
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The following pages link to The contribution of the electrostatic proximity force to atomic force microscopy with insulators (Q2478891):
Displaying 3 items.
- Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method (Q443314) (← links)
- Variational treatment of electrostatic interaction force in atomic force microscopy (Q957851) (← links)
- An improved proximity force approximation for electrostatics (Q1758495) (← links)