Pages that link to "Item:Q268875"
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The following pages link to A fitted finite element method for the numerical approximation of void electro-stress migration (Q268875):
Displaying 4 items.
- Finite element approximation of a three dimensional phase field model for void electromigration (Q618416) (← links)
- A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (Q1306116) (← links)
- Three-dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion (Q1968692) (← links)
- An unfitted finite element method for the numerical approximation of void electromigration (Q2517475) (← links)