Pages that link to "Item:Q427733"
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The following pages link to Design, analysis and test of logic circuits under uncertainty (Q427733):
Displaying 11 items.
- Methods of testability analysis for digital logic (Q584226) (← links)
- Yield analysis of partial defect tolerant bit-plane array (Q980319) (← links)
- Novel algorithms for fast statistical analysis of scaled circuits (Q1040884) (← links)
- NBTI-aware transient fault rate analysis method for logic circuit based on probability voltage transfer characteristics (Q1736761) (← links)
- A state-of-the-art current mirror-based reliable wide fan-in FinFET domino OR gate design (Q2003201) (← links)
- Accurate reliability analysis method for quantum-dot cellular automata circuits (Q2809129) (← links)
- Output-signal processing algorithms in statistical checking of logic circuits (Q3887350) (← links)
- (Q4025671) (← links)
- Flexible reliability assessment of digital circuits based on signal probability (Q4960702) (← links)
- Approximate reasoning about logic circuits with single-fan-out unreliable gates (Q5498867) (← links)
- Modelling reliability of reversible circuits with 2D second-order cellular automata (Q6558849) (← links)