Pages that link to "Item:Q4319536"
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The following pages link to Sequential Defect Removal Sampling (Q4319536):
Displaying 9 items.
- Designing repetitive screening procedures with imperfect inspections: an empirical Bayes approach (Q323229) (← links)
- Monte Carlo analysis of estimation methods for the prediction of customer response patterns in direct marketing (Q439442) (← links)
- Defect rate evaluation via simple active learning (Q740115) (← links)
- The method of combined inspection (Q844056) (← links)
- Bayesian inspection model with the negative binomial prior in the presence of inspection errors (Q884043) (← links)
- The effect of testing errors on a repetitive testing process (Q1926710) (← links)
- Bayesian Analysis of the Sequential Inspection Plan via the Gibbs Sampler (Q3392167) (← links)
- A Simple Inspection Scheme for Two Types of Defect (Q3802462) (← links)
- ESTIMATING THE RATE OF DEFECTS UNDER IMPERFECT SAMPLING INSPECTION—A NEW APPROACH (Q5051905) (← links)