Pages that link to "Item:Q4443356"
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The following pages link to Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection (Q4443356):
Displaying 3 items.
- Non-referential, self-compared shape defect inspection for bond pads with deformed shapes (Q3012662) (← links)
- Image denoising based on edge detection and prethresholding Wiener filtering of multi-wavelets fusion (Q3451215) (← links)
- Ball grid array (BGA) substrate conduct paths inspection using two-dimensional wavelet transform (Q4706315) (← links)