Pages that link to "Item:Q5056606"
From MaRDI portal
The following pages link to OPTIMAL DESIGN OF SIMPLE STEP-STRESS ACCELERATED LIFE TESTS FOR ONE-SHOT DEVICES UNDER EXPONENTIAL DISTRIBUTIONS (Q5056606):
Displaying 4 items.
- Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution (Q2876115) (← links)
- Statistical equivalency and optimality of simple step-stress accelerated test plans for the exponential distribution (Q3120583) (← links)
- A Bayesian Approach for Step-Stress-Accelerated Life Tests for One-Shot Devices Under Exponential Distributions (Q5051085) (← links)
- Optimal Design for Step-Stress Accelerated Degradation Test with Multiple Performance Characteristics Based on Gamma Processes (Q5417924) (← links)