Pages that link to "Item:Q5079055"
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The following pages link to Designing variables sampling plans based on the yield index <i>S<sub>pk</sub></i> (Q5079055):
Displaying 5 items.
- An optimal construction of yield-based EWMA repetitive multivariate sampling plan (Q6053879) (← links)
- Integrated QSS-RS plans based on the process yield index for lot acceptance determination (Q6067511) (← links)
- Developing process-yield-based acceptance sampling plans for AR(1) auto-correlated process (Q6082989) (← links)
- Optimal skip-lot sampling plan based on the yield index for auto-correlated data (Q6552984) (← links)
- An efficient partial sampling inspection for lot sentencing based on process yield (Q6601576) (← links)