Pages that link to "Item:Q5138096"
From MaRDI portal
The following pages link to Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096):
Displaying 3 items.
- Bayesian accelerated life testing under competing log-location-scale family of causes of failure (Q736577) (← links)
- Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784) (← links)
- Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data (Q6068060) (← links)