Pages that link to "Item:Q5150757"
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The following pages link to LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS (Q5150757):
Displaying 15 items.
- Tests with stuck-at and shift faults on circuit inputs (Q831000) (← links)
- Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder (Q2096002) (← links)
- Tests concerning certain types of faults at the scheme inputs (Q2287401) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Short complete diagnostic tests for logic circuits in one infinite basis (Q2688118) (← links)
- Short complete diagnostic tests for circuits implementing linear Boolean functions (Q2690960) (← links)
- On the number of minimal tests checking the block circuits of parity functions for closings (Q4522715) (← links)
- Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
- Lower bounds for the length of test sequences using UIOs (Q4698227) (← links)
- Short complete diagnostic tests for circuits with one additional input in the standard basis (Q5089860) (← links)
- Short complete diagnostic tests for circuits with two additional inputs in some basis (Q6051966) (← links)
- On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits (Q6084899) (← links)
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates (Q6548979) (← links)
