Pages that link to "Item:Q5220763"
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The following pages link to Estimating the Pareto parameters under progressive censoring data for constant-partially accelerated life tests (Q5220763):
Displaying 9 items.
- Computational comparison of prediction future lifetime of electronic components with Pareto distribution based on multiply type II censored samples (Q879493) (← links)
- Constant-partially accelerated life tests for Burr type-XII distribution with progressive type-II censoring (Q961668) (← links)
- Empirical estimation based on progressive first failure censored generalized Pareto data (Q1636741) (← links)
- Bayesian inference for step-stress partially accelerated competing failure model under type II progressive censoring (Q1792801) (← links)
- Statistical analysis of type-I progressively hybrid censored data under constant-stress life testing model (Q2156842) (← links)
- Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring (Q2943790) (← links)
- Estimation of the parameters of pareto distribution and the reliability function usin accelerated life testing with censoring (Q4232087) (← links)
- Estimation of maintenance costs under partially accelerated life tests with multiply censoring for reduced Kies distribution (Q6594138) (← links)
- Inference on Weibull inverted exponential distribution under progressive first-failure censoring with constant-stress partially accelerated life test (Q6640122) (← links)
