Pages that link to "Item:Q5259163"
From MaRDI portal
The following pages link to Optimal Designing of Variables Sampling Plan for Resubmitted Lots (Q5259163):
Displaying 17 items.
- Variable sampling inspection for resubmitted lots based on process capability index \(C_{pk}\) for normally distributed items (Q350356) (← links)
- Variables sampling inspection scheme for resubmitted lots based on the process capability index \(C_{pk}\) (Q439424) (← links)
- Designing a repetitive group sampling plan for Weibull distributed processes (Q1793360) (← links)
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information (Q2023984) (← links)
- Controlling posterior producer and consumer risks in lot reinspection (Q2281834) (← links)
- Designing of two mixed variable lot-size sampling plans using repetitive sampling and resampling based on the process capability index (Q2958396) (← links)
- Sampling inspection for resubmitted lots (Q4387691) (← links)
- Designing a multiple state repetitive group sampling plan based on the coefficient of variation (Q4607372) (← links)
- Determination of a new mixed variable lot-size multiple dependent state sampling plan based on the process capability index (Q4638731) (← links)
- Optimal design of variable acceptance sampling plans for mixture distribution (Q5036912) (← links)
- Combined attri-vari inspection policy for resubmitted lots based on the process capability index (Q5042137) (← links)
- Optimal designing of two-level skip-lot sampling reinspection plan (Q5073381) (← links)
- Economic design of quick switching sampling system for resubmitted lots (Q5076881) (← links)
- A new multiple dependent state sampling plan based on the process capability index (Q5082644) (← links)
- Resubmitted lots with single sampling plans by attributes under the conditions of zero-inflated poisson distribution (Q5267878) (← links)
- An optimal construction of yield-based EWMA repetitive multivariate sampling plan (Q6053879) (← links)
- An efficient partial sampling inspection for lot sentencing based on process yield (Q6601576) (← links)