Pages that link to "Item:Q5321969"
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The following pages link to Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes (Q5321969):
Displaying 16 items.
- A GLM approach to step-stress accelerated life testing with interval censoring (Q665030) (← links)
- A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests (Q745345) (← links)
- Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under type-II censoring (Q951084) (← links)
- LSE method using the CHSS model (Q1007447) (← links)
- Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions (Q1709418) (← links)
- Exact likelihood-ratio tests for a simple step-stress cumulative exposure model with censored exponential data (Q2195943) (← links)
- Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution (Q2218632) (← links)
- A new statistical inference method for multi-stress accelerated life testing based on random variable transformation (Q2240307) (← links)
- Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring (Q2284722) (← links)
- Exact inference for a simple step-stress model with type-I hybrid censored data from the exponential distribution (Q2382848) (← links)
- Maximum likelihood estimation and bootstrap confidence intervals for a simple step-stress accelerated generalized exponential model with type-II censored data (Q2809341) (← links)
- Point estimation of lower quantiles based on two-sampling scheme (Q2816855) (← links)
- On Parameter Inference for Step-Stress Accelerated Life Test with Geometric Distribution (Q2920005) (← links)
- Comparison between constant-stress and step-stress accelerated life tests under a cost constraint for progressive type I censoring (Q4987188) (← links)
- Analysis of simple step-stress model in presence of competing risks (Q5222455) (← links)
- Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution (Q6073183) (← links)