Pages that link to "Item:Q600929"

The following pages link to Phase field computations for surface diffusion and void electromigration in \({\mathbb{R}^3}\) (Q600929):

Displaying 7 items.

• Upper bounds for coarsening for the deep quench obstacle problem (Q609624) (← links)
• Finite element approximation of a three dimensional phase field model for void electromigration (Q618416) (← links)
• A multigrid method for the Cahn-Hilliard equation with obstacle potential (Q1029362) (← links)
• A numerical study of electro-migration voiding by evolving level set functions on a fixed Cartesian grid (Q1306116) (← links)
• Three-dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion (Q1968692) (← links)
• A phase field model for the electromigration of intergranular voids (Q2468800) (← links)
• On the stable discretization of strongly anisotropic phase field models with applications to crystal growth (Q5404723) (← links)