Pages that link to "Item:Q6049270"
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The following pages link to Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks (Q6049270):
Displaying 3 items.
- On the choice of the optimal tuning parameter in robust one-shot device testing analysis (Q2087079) (← links)
- Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data (Q2338101) (← links)
- Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution (Q6073183) (← links)
