Pages that link to "Item:Q618416"
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The following pages link to Finite element approximation of a three dimensional phase field model for void electromigration (Q618416):
Displaying 13 items.
- A fitted finite element method for the numerical approximation of void electro-stress migration (Q268875) (← links)
- Phase field computations for surface diffusion and void electromigration in \({\mathbb{R}^3}\) (Q600929) (← links)
- A multigrid solver for phase field simulation of microstructure evolution (Q975014) (← links)
- On stable parametric finite element methods for the Stefan problem and the Mullins-Sekerka problem with applications to dendritic growth (Q995246) (← links)
- Numerical simulations of immiscible fluid clusters (Q1021629) (← links)
- A multigrid method for the Cahn-Hilliard equation with obstacle potential (Q1029362) (← links)
- Cahn-Hilliard-Brinkman systems for tumour growth (Q2062938) (← links)
- A phase field model for the electromigration of intergranular voids (Q2468800) (← links)
- A diffuse-interface approach for solid-state dewetting with anisotropic surface energies (Q2688952) (← links)
- Overhang penalization in additive manufacturing via phase field structural topology optimization with anisotropic energies (Q2694472) (← links)
- On the stable discretization of strongly anisotropic phase field models with applications to crystal growth (Q5404723) (← links)
- Phase field topology optimisation for 4D printing (Q6102342) (← links)
- Complex pattern formation governed by a Cahn-Hilliard-Swift-Hohenberg system: analysis and numerical simulations (Q6633034) (← links)
