Pages that link to "Item:Q736577"

The following pages link to Bayesian accelerated life testing under competing log-location-scale family of causes of failure (Q736577):

Displaying 8 items.

• Objective Bayesian analysis of accelerated competing failure models under type-I censoring (Q553504) (← links)
• Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931) (← links)
• Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784) (← links)
• Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure (Q2876219) (← links)
• Bayesian statistical analysis of accelerated life tests for log-stable distributions (Q2885639) (← links)
• Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096) (← links)
• Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data (Q6068060) (← links)
• Highly accelerated life testing (HALT): a review from a statistical perspective (Q6642754) (← links)