Pages that link to "Item:Q840474"
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The following pages link to Nonlinear dynamics, stability and control of the scan process in noncontacting atomic force microscopy (Q840474):
Displaying 4 items.
- An electrically actuated imperfect microbeam: dynamical integrity for interpreting and predicting the device response (Q400158) (← links)
- Asymptotic analysis of a noncontact AFM microcantilever sensor with external feedback control (Q490494) (← links)
- Melnikov-based dynamical analysis of microcantilevers in scanning probe microscopy (Q1974259) (← links)
- Nonlinear dynamics of atomic–force–microscope probes driven in Lennard–Jones potentials (Q3043474) (← links)