Pages that link to "Item:Q989726"
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The following pages link to Dynamic delamination of patterned thin films: a numerical study (Q989726):
Displaying 6 items.
- A theoretical and numerical study of thin film delamination using the pull-off test (Q598080) (← links)
- In-situ characterization of interface delamination by a new miniature mixed mode bending setup (Q1041367) (← links)
- Dynamic buckling delamination of a bonded thin film under residual compression (Q1310699) (← links)
- Destruction of thin films with damaged substrate as a result of waves localization (Q2262817) (← links)
- Experimental and theoretical investigations of delamination at free edge of interface between piezoelectric thin films on a substrate (Q2458761) (← links)
- (Q4338618) (← links)