Pages that link to "Item:Q1705602"
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The following pages link to Test pattern generation effort evaluation of reversible circuits (Q1705602):
Displaying 3 items.
- Automatic test pattern generation for multiple missing gate faults in reversible circuits. Work in progress report (Q1705604) (← links)
- Fault diagnosis in reversible circuits under missing-gate fault model (Q1952518) (← links)
- Efficient techniques for fault detection and location of multiple controlled Toffoli-based reversible circuit (Q2099595) (← links)