Pages that link to "Item:Q1736761"
From MaRDI portal
The following pages link to NBTI-aware transient fault rate analysis method for logic circuit based on probability voltage transfer characteristics (Q1736761):
Displaying 3 items.
- New-age: A negative bias temperature instability-estimation framework for microarchitectural components (Q839019) (← links)
- NBTI and power reduction using an input vector control and supply voltage assignment method (Q1657059) (← links)
- A state-of-the-art current mirror-based reliable wide fan-in FinFET domino OR gate design (Q2003201) (← links)