Pages that link to "Item:Q1741479"
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The following pages link to Lower bounds for the lengths of single tests for Boolean circuits (Q1741479):
Displaying 9 items.
- A bound on information cost of circuit diagnosing tests (Q1173078) (← links)
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder (Q2096002) (← links)
- The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Lower Bounds for Testing Computability by Small Width OBDDs (Q3010413) (← links)
- On the number of minimal tests checking the block circuits of parity functions for closings (Q4522715) (← links)
- Lower bounds for the length of test sequences using UIOs (Q4698227) (← links)
- A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS (Q5151288) (← links)