Pages that link to "Item:Q2136299"
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The following pages link to Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases (Q2136299):
Displaying 6 items.
- The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
- Single fault diagnostic tests for inversion faults of circuit elements over some bases (Q2319832) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- Shannon function of the test length with respect to gate input identification (Q6195911) (← links)
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates (Q6494792) (← links)