Pages that link to "Item:Q2462127"
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The following pages link to The effect of testing equipment shift on optimal decisions in a repetitive testing process (Q2462127):
Displaying 10 items.
- Designing repetitive screening procedures with imperfect inspections: an empirical Bayes approach (Q323229) (← links)
- Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272) (← links)
- Diagnostic errors and repetitive sequential classifications in on-line process control by attributes (Q1044161) (← links)
- The effect of testing errors on a repetitive testing process (Q1926710) (← links)
- Integrating on-line process control and imperfect corrective maintenance: an economical design (Q1926932) (← links)
- On-Line Process Control using Attributes with Misclassification Errors: An Economical Design for Short-Run Production (Q2920006) (← links)
- Online control by attributes in the presence of classification errors with variable inspection interval (Q3178645) (← links)
- An analysis of Taguchi's on-line quality monitoring procedure for variables based on the results of a sequence of inspections (Q4904332) (← links)
- The Variable Sampling Interval (VSI) in an Analysis of Taguchi's On-line Quality Monitoring Procedure for Variables (Q4921652) (← links)
- An analysis of online quality control by attributes with an imperfect classification system and inspections with samples of size <i>n</i> (Q6049865) (← links)
