Pages that link to "Item:Q2629840"

The following pages link to Method of synthesis of easily testable circuits admitting single fault detection tests of constant length (Q2629840):

Displaying 20 items.

• A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length (Q355292) (← links)
• Universal synthesis algorithm for 1/n testers (Q790789) (← links)
• Single fault detection tests for generalized iterative switching circuits (Q887392) (← links)
• Method of synthesis of easily tested circuits (Q1105569) (← links)
• Lower bounds for the lengths of single tests for Boolean circuits (Q1741479) (← links)
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
• Easily testable realization of a circuit on the basis of polynomial representation of output functions (Q1778381) (← links)
• Synthesizing testable combinational circuits (Q1882093) (← links)
• Converting circuits of functional elements into easily testable forms (Q1920123) (← links)
• Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder (Q2096002) (← links)
• The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320) (← links)
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements (Q2356509) (← links)
• Estimations of the lengths of tests for logic gates in presence of many permissible faults (Q3186843) (← links)
• (Q3696841) (← links)
• Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates (Q4558289) (← links)
• Short single fault detection tests for logic networks under arbitrary faults of gates (Q5071224) (← links)
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
• On the exact value of the length of the minimal single diagnostic test for a particular class of circuits (Q5374004) (← links)