Pages that link to "Item:Q3392320"
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The following pages link to Modelling of microstructural void evolution with configurational forces (Q3392320):
Displaying 3 items.
- A multiscale approach to damage configurational forces (Q933260) (← links)
- RVE-based studies on the coupled effects of void size and void shape on yield behavior and void growth at micron scales (Q2495885) (← links)
- Anisotropy and softening induced by void growth: A numerical simulation of micro-structural process (Q3823865) (← links)