Pages that link to "Item:Q3540848"
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The following pages link to Fast non-iterative methods for defect identification (Q3540848):
Displaying 8 items.
- Defect detection from multi-frequency limited data via topological sensitivity (Q275333) (← links)
- Topological derivative for imaging of thin electromagnetic inhomogeneity: least condition of incident directions (Q1629163) (← links)
- Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks (Q1685474) (← links)
- Detection of small inhomogeneities via direct sampling method in transverse electric polarization (Q1996399) (← links)
- An augmented time reversal method for source and scatterer identification (Q2002231) (← links)
- Shape identification of open sound-hard arcs without priori information in limited-view inverse scattering problem (Q2107180) (← links)
- Investigation of a non-iterative technique based on topological derivatives for fast localization of small conductivity inclusions (Q2159907) (← links)
- Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-Dimensional Electromagnetism. Part II: Iterative Method (Q4686934) (← links)