Pages that link to "Item:Q355292"

The following pages link to A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length (Q355292):

Displaying 9 items.

• Single fault detection tests for circuits of functional elements (Q469094) (← links)
• Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1'' at gate outputs (Q828193) (← links)
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs (Q949220) (← links)
• Method of synthesis of easily tested circuits (Q1105569) (← links)
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
• Synthesizing testable combinational circuits (Q1882093) (← links)
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length (Q2629840) (← links)
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements (Q3057821) (← links)
• (Q3696841) (← links)