Pages that link to "Item:Q4198656"
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The following pages link to Simplified ATPG and analog fault location via a clustering and separability technique (Q4198656):
Displaying 3 items.
- Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach (Q1908843) (← links)
- A unified decomposition approach for fault location in large analog circuits (Q3331137) (← links)
- An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults (Q4956704) (← links)