The following pages link to (Q4980449):
Displaying 11 items.
- Bayesian analysis for step-stress accelerated life testing using Weibull proportional hazard model (Q744803) (← links)
- A Bayesian analysis of reliability in accelerated life tests using Gibbs sampler (Q1861612) (← links)
- Change-point detection of failure mechanism for electronic devices based on Arrhenius model (Q2182931) (← links)
- Bayesian analysis of constant-stress accelerated life test for the Weibull distribution using noninformative priors (Q2285323) (← links)
- Constant Stress Accelerated Life Test on a Multiple-Component Series System under Weibull Lifetime Distributions (Q2876214) (← links)
- Bayesian Accelerated Life Testing under Competing Weibull Causes of Failure (Q2876219) (← links)
- Bayesian estimation of constant stress accelerated life testing with Weibull distribution (Q2927455) (← links)
- Bayesian analysis of life-testing problems involving the weibull distribution (Q3783393) (← links)
- (Q4999859) (← links)
- Statistical analysis of accelerated temperature cycling test based on Coffin-Manson model (Q5077452) (← links)
- Bayesian Approach for Constant-Stress Accelerated Life Testing for Kumaraswamy Weibull Distribution with Censoring (Q5888649) (← links)
