Pages that link to "Item:Q5071224"
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The following pages link to Short single fault detection tests for logic networks under arbitrary faults of gates (Q5071224):
Displaying 11 items.
- Single fault detection tests for circuits of functional elements (Q469094) (← links)
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases (Q2136299) (← links)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
- Short complete diagnostic tests for circuits implementing linear Boolean functions (Q2690960) (← links)
- Detecting tests for Boolean functions in presence of local linear faults of the inputs of circuits (Q3186817) (← links)
- MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE (Q3741577) (← links)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two (Q4973245) (← links)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES (Q5151082) (← links)
- Friedman's question: Detectability of bridging faults in irredundant computational logic networks (Q5202145) (← links)
- Shannon function of the test length with respect to gate input identification (Q6195911) (← links)
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates (Q6494792) (← links)
