Pages that link to "Item:Q5223987"
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The following pages link to Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution (Q5223987):
Displaying 6 items.
- An adjusted Grubbs' and generalized extreme studentized deviation (Q2075492) (← links)
- On the choice of the optimal tuning parameter in robust one-shot device testing analysis (Q2087079) (← links)
- Power divergence approach for one-shot device testing under competing risks (Q2088826) (← links)
- Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data (Q2338101) (← links)
- Robust Wald-type tests based on minimum Rényi pseudodistance estimators for the multiple linear regression model (Q5036901) (← links)
- Testing linear hypotheses in logistic regression analysis with complex sample survey data based on phi-divergence measures (Q5079132) (← links)
