Pages that link to "Item:Q5349152"
From MaRDI portal
The following pages link to Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal (Q5349152):
Displaying 5 items.
- Reliability nonparametric Bayesian estimation for the masked data of parallel systems in step-stress accelerated life tests (Q730563) (← links)
- Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing (Q2876122) (← links)
- Accelerated life tests for log-normal series system with dependent masked data under Type-I progressive hybrid censoring (Q2974961) (← links)
- Joint modeling of linear degradation and failure time data with masked causes of failure under simple step-stress test (Q4960631) (← links)
- ELS algorithm for estimating open source software reliability with masked data considering both fault detection and correction processes (Q5104488) (← links)