Pages that link to "Item:Q956900"
From MaRDI portal
The following pages link to A bi-aspect nonparametric test for the multi-sample location problem (Q956900):
Displaying 20 items.
- A combined test for differences in scale based on the interquantile range (Q434380) (← links)
- Nonparametric bootstrap tests of conditional independence in two-way contingency tables (Q450866) (← links)
- An efficient nonparametric test for bivariate two-sample location problem (Q713823) (← links)
- Parametric and permutation testing for multivariate monotonic alternatives (Q746304) (← links)
- Multiple aspect testing for case-control designs (Q811967) (← links)
- A bi-aspect nonparametric test for the two-sample location problem (Q956806) (← links)
- Nonparametric and robust methods. (Editorial) (Q1020166) (← links)
- Applications in business, medical and industrial statistics of bi-aspect nonparametric tests for location problems (Q1767002) (← links)
- On the asymptotic behaviour of location-scale invariant Bickel-Rosenblatt tests (Q2433820) (← links)
- A Nonparametric Test Procedure Based on a Group of Quantile Tests (Q3015883) (← links)
- A Modified Hall-Padmanabhan Test for the Homogeneity of Scales (Q3167845) (← links)
- A class of multisample multivariate nonparametric tests for location-scale (Q3473198) (← links)
- Moment-based multivariate permutation tests for ordinal categorical data (Q3523676) (← links)
- A Nonparametric Test for the One-Sample Bivariate Location Problem (Q3598664) (← links)
- M-estimation of k-sample location parameters; a two-sided preliminary test approach (Q4839316) (← links)
- A Distribution Free Test for the Equality of Scales (Q4905888) (← links)
- Nonparametric Simultaneous Tests for Location and Scale Testing: A Comparison of Several Methods (Q4929164) (← links)
- Multivariate Bi-Aspect Testing for the Two-Sample Location Problem (Q5201505) (← links)
- A New Scale-Invariant Nonparametric Test for Two-Sample Bivariate Location Problem with Application (Q5280267) (← links)
- Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics (Q6570836) (← links)
