Pages that link to "Item:Q958320"
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The following pages link to Residual-based localization and quantification of peaks in X-ray diffractograms (Q958320):
Displaying 7 items.
- diffractometry (Q23052) (← links)
- On the estimation of variance parameters in non-standard generalised linear mixed models: application to penalised smoothing (Q123852) (← links)
- Locally adaptive image denoising by a statistical multiresolution criterion (Q425650) (← links)
- Quantifying the cost of simultaneous non-parametric approximation of several samples (Q1952000) (← links)
- Comment on ``Local quantile regression'' (Q2434699) (← links)
- Sums of smooth exponentials to decompose complex series of counts (Q5142150) (← links)
- Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis (Q5861251) (← links)