Adhesion dynamics in probing micro- and nanoscale thin solid films (Q1023187)

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scientific article; zbMATH DE number 5564134
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Adhesion dynamics in probing micro- and nanoscale thin solid films
scientific article; zbMATH DE number 5564134

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    Adhesion dynamics in probing micro- and nanoscale thin solid films (English)
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    11 June 2009
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    Summary: This study focuses on modeling the probe dynamics in scratching and indenting thin solid films at micro- and nanoscales. The model identifies bifurcation conditions that define the stick-slip oscillation patterns of the tip. It is found that the local energy fluctuations as a function of the inelastic deformation, defect formation, material properties, and contact parameters determine the oscillation behavior. The transient variation of the localized function makes the response nonlinear at the adhesion junction. By quantifying the relation between the bifurcation parameters and the oscillation behavior, this model gives a realistic representation of the complex adhesion dynamics. Specifically, the model establishes the link between the stick-slip behavior and the inelastic deformation and the local potentials. This model justifies the experimental observations and the molecular dynamics simulation of the adhesion and friction dynamics in both the micro- and nanoscale contact.
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