Reduction of diagnostic information for testing of digital modules (Q1177645)
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scientific article; zbMATH DE number 20806
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Reduction of diagnostic information for testing of digital modules |
scientific article; zbMATH DE number 20806 |
Statements
Reduction of diagnostic information for testing of digital modules (English)
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26 June 1992
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testing of digital modules
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combinational circuits
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circuit with memory
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