Error classification and yield prediction of chips in semiconductor industry applications. (Q1862962)
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scientific article; zbMATH DE number 1885884
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Error classification and yield prediction of chips in semiconductor industry applications. |
scientific article; zbMATH DE number 1885884 |
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Error classification and yield prediction of chips in semiconductor industry applications. (English)
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22 September 2003
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Adaptive Resonance Theory
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Process-Control-Monitoring
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0.7207056879997253
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0.6810845136642456
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