Implicit-explicit multistep finite element methods for the semiconductor device problem. (Q1873642)
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scientific article; zbMATH DE number 1917034
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Implicit-explicit multistep finite element methods for the semiconductor device problem. |
scientific article; zbMATH DE number 1917034 |
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Implicit-explicit multistep finite element methods for the semiconductor device problem. (English)
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2003
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Optimal \(L^2\)-norm error estimates are derived for a numerical method to compute the transient behaviour of a semiconductor device. The Poisson equation for the electric potential is discretized by a finite element method (FEM), and electron and hole density equations are treated by implicit-explicit multistep FEMs.
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semiconductor device
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strong stability
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multistep methods
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finite element methods
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error estimates
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Poisson equation
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implicit-explicit multistep methods
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