A test algorithm for multiple-valued logic combinational circuits (Q1881836)
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scientific article; zbMATH DE number 2108407
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A test algorithm for multiple-valued logic combinational circuits |
scientific article; zbMATH DE number 2108407 |
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A test algorithm for multiple-valued logic combinational circuits (English)
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18 October 2004
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