Reliability analysis for devices subject to competing failure processes based on chance theory (Q1985115)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Reliability analysis for devices subject to competing failure processes based on chance theory |
scientific article; zbMATH DE number 7187237
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Reliability analysis for devices subject to competing failure processes based on chance theory |
scientific article; zbMATH DE number 7187237 |
Statements
Reliability analysis for devices subject to competing failure processes based on chance theory (English)
0 references
7 April 2020
0 references
competing failure processes
0 references
shock models
0 references
uncertainty theory
0 references
uncertain variable
0 references
uncertain distribution
0 references
0 references
0 references
0 references
