New insights into error accumulation due to biased particle distribution in semi-implicit particle methods (Q2060130)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: New insights into error accumulation due to biased particle distribution in semi-implicit particle methods |
scientific article; zbMATH DE number 7442789
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | New insights into error accumulation due to biased particle distribution in semi-implicit particle methods |
scientific article; zbMATH DE number 7442789 |
Statements
New insights into error accumulation due to biased particle distribution in semi-implicit particle methods (English)
0 references
13 December 2021
0 references
MPS method
0 references
free surface
0 references
high order schemes
0 references
error accumulation
0 references
stability
0 references
biased particle distribution
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0 references
